The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Dec. 01, 2010
Dong-yun Kim, Yongin-si, KR;
Dong-hoon Yeo, Ansan-si, KR;
Hyun-chul Shin, Ansan-si, KR;
Kyung-ho Kim, Seongnam-si, KR;
Byung-tae Kang, Seoul, KR;
Ju-yong Shin, Ansan-si, KR;
Sung-chul Lee, Ansan-si, KR;
Dong-Yun Kim, Yongin-si, KR;
Dong-Hoon Yeo, Ansan-si, KR;
Hyun-Chul Shin, Ansan-si, KR;
Kyung-Ho Kim, Seongnam-si, KR;
Byung-Tae Kang, Seoul, KR;
Ju-Yong Shin, Ansan-si, KR;
Sung-Chul Lee, Ansan-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
IUCF-HYU (Industry-University Cooperation Foundation Hanyang University), Seoul, KR;
Abstract
A semiconductor apparatus and a design method for the semiconductor apparatus allow debugging or repairs by using a spare cell. The semiconductor apparatus includes a plurality of metal layers. At least one repair block performs a predetermined function. A spare block is capable of substituting for a function of the repair block. And at least one of the plurality of metal layers is predetermined to be a repair layer for error revision. At least one pin of the repair block is connected to the repair layer through a first pin extension, and at least one pin of the spare block is capable of extending to the repair layer. When the repair block is to be repaired, the pin extension of the repair layer and the repair block is disconnected, and at least one pin of the spare block is connected to the repair layer through a second pin extension.