The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2014

Filed:

Jun. 29, 2012
Applicants:

Sean C. Dolan, Belmont, MA (US);

Hui Wang, Upton, MA (US);

Marik Marshak, Newton, MA (US);

Xiaomei Liu, Natick, MA (US);

Owen Martin, Hopedale, MA (US);

Alexandr Veprinsky, Brookline, MA (US);

Ahmet Kirac, Guttenberg, NJ (US);

Inventors:

Sean C. Dolan, Belmont, MA (US);

Hui Wang, Upton, MA (US);

Marik Marshak, Newton, MA (US);

Xiaomei Liu, Natick, MA (US);

Owen Martin, Hopedale, MA (US);

Alexandr Veprinsky, Brookline, MA (US);

Ahmet Kirac, Guttenberg, NJ (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described is data storage system modeling. Received at a first data storage system is information representing a workload for I/O operations directed to a logical devices having storage provisioned on physical devices of a second data storage system. Information representing the workload may be obtained by performing discovery processing to discover performance characteristics of the physical devices of the second data storage system. Discovery processing may include receiving, at the first data storage system, I/O operations from a client directed to the set of one or more logical devices having storage provisioned on the physical devices of the second data storage system. The I/O operations are then issued to the second data storage system. In response, performance data is obtained at the first data storage system representing the workload for the plurality of I/O operations. Performance of the second data storage system is modeled in accordance with the workload.


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