The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Jun. 17, 2011
Alex Bocharov, Redmond, WA (US);
Christopher A. Meek, Kirkland, WA (US);
BO Thiesson, Woodinville, WA (US);
Alex Bocharov, Redmond, WA (US);
Christopher A. Meek, Kirkland, WA (US);
Bo Thiesson, Woodinville, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
In one embodiment, an event impact signature detector may analyze a time series with external events. A data interfacemay receive a data setrepresenting the time series with external events. A processormay fit the data setinto a baseline time series model. The processormay iteratively determine each event locationfor multiple external eventsaffecting the baseline time series model. The processormay iteratively solve for each event impactof the multiple external eventsfactoring in interactions between the multiple external events