The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2014

Filed:

Jun. 04, 2010
Applicants:

Ching Yu John Tam, Los Gatos, CA (US);

Bridget Bin Wu, Cupertino, CA (US);

Ryan Jeffrey Du Bois, San Francisco, CA (US);

Inventors:

Ching Yu John Tam, Los Gatos, CA (US);

Bridget Bin Wu, Cupertino, CA (US);

Ryan Jeffrey Du Bois, San Francisco, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

An improved system and method for testing a sensor of a portable electronic device based on expected sensor data and not timing information. The system and method for testing a sensor of a portable electronic device retrieves sensed data from the portable electronic device (i.e. device under test) after the device has traversed a series of test areas or zones. The sensed data is compared against a set of expected sensor data patterns to determine which components of the sensed data correspond to each test area or zone. The sensor of the portable electronic device may be tested based on an association of the test areas or zones with segments of the sensed data.


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