The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
May. 18, 2009
Applicants:
Jean-michel Morel, Paris, FR;
Guoshen Yu, Palaiseau, FR;
Inventors:
Jean-Michel Morel, Paris, FR;
Guoshen Yu, Palaiseau, FR;
Assignees:
Ecole Polytechnique, Palaiseau, FR;
Ecole Normale Superieure, Cachan, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for the recognition of objects in at least one digital image includes: a) simulating from the digital image a plurality of digital rotations and at least two digital tilts different from 1 in order to develop a simulated image for each rotation-tilt pair; and b) applying an algorithm generating values that are invariant in translation, rotation and zoom onto the simulated images in order to determine so-called SIF (scale invariant features) local characteristics used for recognizing objects. The SIFT method can be used in step b.