The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2014

Filed:

Jul. 25, 2012
Applicants:

Sachin Moghe, Northbrook, IL (US);

Ilmar Hein, Chicago, IL (US);

Inventors:

Sachin Moghe, Northbrook, IL (US);

Ilmar Hein, Chicago, IL (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/03 (2013.01); Y10S 378/901 (2013.01);
Abstract

A method of computed-tomography and a computed-tomography apparatus in which x-ray projection data is acquired at a number of views for a scan of an object. Partial images are created from data for a desired number of said views. Full scan images are created from plural ones of the partial images. Non-overlapping time images are created from the full-scan images. Gradient images are also created. An improved image is created by weighting respective ones of the full scan and non-overlapping time images using the gradient image. The improved image has increased sharpness with reduced noise.


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