The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2014

Filed:

Jul. 27, 2010
Applicants:

Gopal Biligeri Avinash, Menomonee Falls, WI (US);

Zhongmin S. Lin, New Berlin, WI (US);

Inventors:

Gopal Biligeri Avinash, Menomonee Falls, WI (US);

Zhongmin S. Lin, New Berlin, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for correcting inhomogeneity of spatial intensity in 3D MR image data includes application of a 3D filter to the 3D MR image to generate a first set of data and a second set of data. The first set of data includes a high frequency component and a weak edge component, and the second set of data includes a low frequency component and a strong edge component. The system and method also include derivation of an inhomogeneity correction from the second set of data, application the inhomogeneity correction to the second set of data, and addition of the first set of data to the inhomogeneity corrected second set of data to create a corrected 3D MR image.


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