The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Aug. 07, 2009
Applicants:
Roland Walter, Reilingen, DE;
Andreas Laudat, Meckesheim, DE;
Annett Leonhardt, Meckesheim, DE;
Inventors:
Assignee:
Leica Biosystems Nussloch GmbH, Nussloch, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and a device for producing thin sections of a sample by means of a microtome is described, in which a camera acquires at least one image of a surface generated by sectioning of the sample. With the aid of an evaluation device, the image of the surface is evaluated in terms of predefined characteristic values of a section quality. As a function of the characteristic values that are identified, a decision is then made as to whether the section of the sample is accepted or not.