The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Feb. 08, 2011
Martina Daub, Weissach, DE;
Jochen Rupp, Stuttgart, DE;
Martina Daub, Weissach, DE;
Jochen Rupp, Stuttgart, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
A device and a method for optical parallel analysis of a sample arrangement. The device includes a system of sample areas provided on and/or in a front face of the carrier substrate for receiving a sample substance; a system of detector areas provided on and/or in a back face of the carrier substrate, each detector area being assigned to a corresponding sample area; and a system of optical devices, each optical system being assigned to a corresponding sample area and being designed in such a way that it deflects light beams, which the corresponding sample area in response to an optical excitation does not emit in the direction of a detector area assigned to it, in the direction of the detector area assigned to it and/or in the direction of a detector-free area on the back face of the carrier substrate.