The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Aug. 15, 2012
Steven J. Baumgartner, Zumbro Falls, MN (US);
William D. Corti, New Windsor, NY (US);
Joseph Natonio, Wappingers Falls, NY (US);
Steven J. Baumgartner, Zumbro Falls, MN (US);
William D. Corti, New Windsor, NY (US);
Joseph Natonio, Wappingers Falls, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for testing digital to analog converters (DAC) in a serial interface having a comparator to receive an input signal and a local offset signal is disclosed. A first DAC selectably provides one of a global offset to the input signal during a normal mode of operation and a first test signal to the comparator during a test mode of operation. A second DAC selectably provides one of the local offset signals to the comparator during the normal mode of operation and a second test signal to the comparator during the test mode of operation. A test module may cause the first DAC to determine a first test signal to provide to the local offset input of the comparator and may cause the second DAC to incrementally change a test signal provided to the comparator.