The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8686559 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 01, 2014

Filed:

Sep. 08, 2012
Applicants:

Kerry Bernstein, Underhill, VT (US);

Philip G. Emma, Danbury, CT (US);

Michael Ignatowski, Red Hook, NY (US);

Inventors:

Kerry Bernstein, Underhill, VT (US);

Philip G. Emma, Danbury, CT (US);

Michael Ignatowski, Red Hook, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A stacked semiconductor chip comprising multiple unit chips contains multiple instances of a first chip component that have a low yield and are distributed among the multiple unit chips. An instance of the first chip component within a first unit chip is logically paired with at least another instance of the first chip component within at least another unit chip so that the combination of the multiple instances of the first chip component across the multiple unit chips constitute a functional block providing the functionality of a fully functional instance of the first chip component. The stacked semiconductor chip may include multiple instances of a second chip component having a high yield and distributed across the multiple unit chips. Multiple low yield components constitute a functional block providing an enhanced overall yield, while high yield components are utilized to their full potential functionality.


Find Patent Forward Citations

Bernstein, Kerry. (2014). Semiconductor chip stacking for redundancy and yield improvement (U.S. Patent No. 8686559). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8686559

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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