The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Apr. 29, 2010
Sasan Bakhtiari, Darien, IL (US);
Nachappa Gopalsami, Naperville, IL (US);
Thomas W. Elmer, Westmont, IL (US);
Apostolos C. Raptis, Downers Grove, IL (US);
Sasan Bakhtiari, Darien, IL (US);
Nachappa Gopalsami, Naperville, IL (US);
Thomas W. Elmer, Westmont, IL (US);
Apostolos C. Raptis, Downers Grove, IL (US);
UChicago Argonne, LLC, Chicago, IL (US);
Abstract
A millimeter wavelength (MMW) measurement system for remote detection of object characteristics and methods for detecting such characteristics. The MMW measurement system comprises a front-end and an optional signal conditioning component. The MMW front-end includes an oscillator, a transceiver portion, and an antenna for focusing a detection component comprising micrometer level wavelength electromagnetic radiation onto the object. A portion of the electromagnetic radiation reflected by the object is received by the MMW measurement system, which is indicative of a displacement of the object. The MMW system may be configured to detect micrometer level displacement of the object disposed tens of meters from the MMW measurement system. In various embodiments the object may be a natural object, including a human, and the displacement may be indicative of a heart rate and/or a respiratory function.