The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2014

Filed:

May. 10, 2012
Applicants:

Yohei Kawaguchi, Hachioji, JP;

Yuichiro Hashimoto, Tachikawa, JP;

Masuyuki Sugiyama, Hino, JP;

Shun Kumano, Kokubunji, JP;

Shuhei Hashiba, Wako, JP;

Masahito Togami, Higashiyamato, JP;

Inventors:

Yohei Kawaguchi, Hachioji, JP;

Yuichiro Hashimoto, Tachikawa, JP;

Masuyuki Sugiyama, Hino, JP;

Shun Kumano, Kokubunji, JP;

Shuhei Hashiba, Wako, JP;

Masahito Togami, Higashiyamato, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mass spectrometry system is mounted with (1) an action planning module for determining a measurement schedule provided by a combination of an MS analysis and an MSanalysis (where n≧2) according to a measuring time provided previously; and (2) a mass spectrometry unit having a tandem mass spectrometry function for outputting a mass spectrum obtained by performing each measurement action constructing the measurement schedule.


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