The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Nov. 24, 2010
Stephen Novak, Westfield, IN (US);
Yunxing C. Cui, Carmel, IN (US);
Thomas W. Greene, West Des Moines, IA (US);
Ning Zhou, Zionsville, IN (US);
Stephen Novak, Westfield, IN (US);
Yunxing C. Cui, Carmel, IN (US);
Thomas W. Greene, West Des Moines, IA (US);
Ning Zhou, Zionsville, IN (US);
Dow AgroSciences, LLC., Indianapolis, IN (US);
Abstract
The invention relates in part to methods of detecting an AAD-12 soybean event. The subject invention provides assays for detecting the presence of the subject event in a sample (of soybeans, for example). Kits and conditions useful in conducting the assays are also provided. More specifically, the present invention relates in part to an endpoint TaqMan PCR assay for the AAD-12 soybean event. Some embodiments are directed to assays that are capable of high throughput zygosity analysis. The subject invention further relates, in part, to the discovery of a preferred reference gene for use in determining zygosity. This invention also relates in part to plant breeding using any of the subject methods. In some embodiments, said event/polynucleotide sequence can be 'stacked' with other traits. The subject procedures can be used to uniquely identify soybean lines comprising the event of the subject invention.