The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Sep. 11, 2012
Yoshihiro Moriya, Shizuoka, JP;
Masahide Yamada, Shizuoka, JP;
Taichi Nemoto, Shizuoka, JP;
Yukiko Nakajima, Kanagawa, JP;
Yoshitaka Yamauchi, Shizuoka, JP;
Daiki Yamashita, Kanagawa, JP;
Keiji Makabe, Shizuoka, JP;
Akiyoshi Sabu, Shizuoka, JP;
Suzuka Amemori, Shizuoka, JP;
Yoshihiro Moriya, Shizuoka, JP;
Masahide Yamada, Shizuoka, JP;
Taichi Nemoto, Shizuoka, JP;
Yukiko Nakajima, Kanagawa, JP;
Yoshitaka Yamauchi, Shizuoka, JP;
Daiki Yamashita, Kanagawa, JP;
Keiji Makabe, Shizuoka, JP;
Akiyoshi Sabu, Shizuoka, JP;
Suzuka Amemori, Shizuoka, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A toner including a colorant and a first binder resin is provided. The first binder resin has first and second glass transition points at a temperature Tg1 of −20 to 20° C. and a temperature Tg2 of 35 to 65° C., respectively, measured by a differential scanning calorimeter at a heating rate of 5° C./min. A ratio h1/h2 of a baseline displacement h1 observed in the first glass transition point to a baseline displacement h2 observed in the second glass transition point is less than 1.0. The first binder resin has a structure in which a first phase is dispersed in a second phase. The first and second phases consist of portions having larger and smaller phase difference values, respectively, than an intermediate value between maximum and minimum phase difference values in a binarized phase image obtained by an atomic force microscope with a tapping mode method.