The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2014
Filed:
Dec. 30, 2008
Applicants:
Musun Kwak, Paju-si, KR;
Jae-ha Choi, Gumi, KR;
Hanrok Chung, Daegu, KR;
Inventors:
Assignee:
LG Display Co., Ltd., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
An alignment layer is tested using an AFM (Atomic Force Microscope) and a FT-IR (Fourier Transformation Infrared Spectroscope) under various process conditions so that inferiority of the alignment layer can be detected and optimum process conditions can be obtained, thereby minimizing the inferiority of the alignment layer by applying the optimum process conditions.
Kwak, Musun. (2014). Method of fabricating alignment layer of liquid crystal display device and testing the alignment layer (U.S. Patent No. 8685496). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8685496
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile