The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Jul. 09, 2007
Amitkumar Manoharrao Paradkar, Mohegan Lake, NY (US);
Avik Sinha, New Rochelle, NY (US);
Amitkumar Manoharrao Paradkar, Mohegan Lake, NY (US);
Avik Sinha, New Rochelle, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An automated system and method to generate functional conformance tests for applications are provided. The system and method in one aspect use Inputs, Outputs, Preconditions, Effects (IOPEs) paradigm associated with an application for automatically generating test goals. A planner component may accept these testing goals to generate a sequence of operations or invocations as a test case. Verification sequences are also generated. The system and method also allow generation of executable test cases, which can be applied to the various interfaces through which the application may be accessed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile