The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
May. 16, 2011
Applicant:
Asuka Wada, Yokohama, JP;
Inventor:
Asuka Wada, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
Modeled test cases are created by converting test cases of each component, which describe interface call orders for the component, into expressions with a level of abstraction increased by excluding component unique information included in the test cases using classification information of interfaces provided by the component. Modeled test cases as differences are extracted by comparing the modeled test cases between a plurality of components.
Wada, Asuka. (2014). Information processing apparatus, control method thereof, and computer readable storage medium for supporting test processes for respective software components (U.S. Patent No. 8683427). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8683427
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