The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2014

Filed:

Sep. 30, 2011
Applicants:

Kirubakaran Kaliannan, Beaverton, OR (US);

Venkata Sreenivasa Rao Nagineni, Mountain View, CA (US);

Inventors:

Kirubakaran Kaliannan, Beaverton, OR (US);

Venkata Sreenivasa Rao Nagineni, Mountain View, CA (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for fast I/O path failure detection and cluster wide failover. The method includes accessing a distributed computer system having a cluster including a plurality of nodes, and experiencing an I/O path failure for a storage device. An I/O failure message is generated in response to the I/O path failure. A cluster wide I/O failure message broadcast to the plurality of nodes that designates a faulted controller. Upon receiving I/O failure responses from the plurality of nodes, an I/O queue message is broadcast to the nodes to cause the nodes to queue I/O through the faulted controller and switch to an alternate controller. Upon receiving I/O queue responses from the plurality of nodes, an I/O failover commit message is broadcast to the nodes to cause the nodes to commit to a failover and un-queue their I/O.


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