The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8682685 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 25, 2014

Filed:

Feb. 10, 2006
Applicant:

David P. Katz, Dobbs Ferry, NY (US);

Inventor:

David P. Katz, Dobbs Ferry, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 99/00 (2006.01); G06Q 50/00 (2012.01); A61B 5/00 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a system and methods for facilitating the improvement of data quality generated during drug and medical device clinical trials. In one embodiment, the invention includes a system and method for generating an ideal subject suitability score for one or more interaction points of a clinical trial. One or more individual subject suitability scores may then be generated from actual subject interaction with the clinical trial for each of the interaction points of the clinical trial. For each interaction point for which an ideal subject suitability score is generated, the one or more individual subject suitability scores may be compared to the ideal subject suitability score to determine the deviation there between. The quality of data collected from actual subject interaction with the clinical trial may be a function of the difference between the individual and ideal subject suitability scores.


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