The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Dec. 18, 2009
Mirrasoul Mousavi, Cary, NC (US);
Rohit Moghe, Atlanta, GA (US);
Mirrasoul Mousavi, Cary, NC (US);
Rohit Moghe, Atlanta, GA (US);
ABB Research Ltd, Zurich, CH;
Abstract
There is described herein the extension of the application of the Laplace Test Statistic for trend analysis and prediction of incipient faults for power systems. The extensions consider the situation where two parameters believed to contribute explicitly to the eventual failure are monitored. The developed extensions applied to actual incipient failure events provide promising results for prediction of the impending failure. It is demonstrated that by incorporating two parameters in the trend analysis, the robustness to outliers is increased and the flexibility is augmented by increasing the degrees of freedom in the generation of the alarm signal.