The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2014

Filed:

Jul. 01, 2009
Applicants:

Su Woong Lee, Daejeon, KR;

Junsuk Lee, Daejeon, KR;

Yong Hun Kim, Daejeon, KR;

Seokjae Lee, Daejeon, KR;

Sangwon Um, Daejeon, KR;

Shihua Ming, Daejeon, KR;

Inventors:

Su Woong Lee, Daejeon, KR;

Junsuk Lee, Daejeon, KR;

Yong Hun Kim, Daejeon, KR;

Seokjae Lee, Daejeon, KR;

Sangwon Um, Daejeon, KR;

Shihua Ming, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for recognizing markers printed on a learning material, includes sampling an image of the learning material; grouping the sampled image of pixels into a first image group and a second image group based on a threshold; and calculating medians of the first image group and the second image group to update the threshold with a first average value of the calculated medians. Further, the method for recognizing markers printed on the learning material includes repeating the above until a difference between a previous threshold and an updated threshold is equal to or smaller than a reference value; binarizing an image captured by a camera based on the updated threshold; and detecting the markers based on the binary image.


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