The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
May. 31, 2011
Thomas Boettger, Heidelberg, DE;
Thomas Boettger, Heidelberg, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
The present embodiments relate to a method for checking a segmentation of a structure in image data, where the segmentation to be checked provides a segmentation region that approximates the structure imaged in the image data and that is delimited by a segmentation contour. The method includes spatially resolved automatic determination of characteristic values that are suitable for serving as an indicator of the accuracy of the segmentation of the structure on the basis of the image data, the segmentation contour to be checked, or a segmentation method applied during the performance of the segmentation to be checked. The method also includes spatially resolved automatic determination of confidence values for a plurality of positions on the segmentation contour using the characteristic values determined for the corresponding positions. The confidence values may indicate the reliability of the segmentation to be checked at the corresponding positions.