The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Jun. 01, 2012
Applicants:
Josh Star-lack, Palo Alto, CA (US);
Mingshan Sun, Menlo Park, CA (US);
Inventors:
Josh Star-Lack, Palo Alto, CA (US);
Mingshan Sun, Menlo Park, CA (US);
Assignee:
Varian Medical Systems, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/03 (2013.01);
Abstract
A system and method for forming an adjusted estimate of scattered radiation in a radiographic projection of a target object, which incorporates scattered radiation from objects adjacent to the target object, such as a patient table. A piercing point equalization method is disclosed, and a refinement of analytical kernel methods which utilizes hybrid kernels is also disclosed.
Quick Actions:
Star-Lack, Josh. (2014). Methods of scatter correction of x-ray projection data 2 (U.S. Patent No. 8682055). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8682055
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile