The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2014

Filed:

Dec. 19, 2012
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Naoki Kuwata, Nagano-ken, JP;

Yoshihiro Nakami, Nagano-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01); H04N 1/38 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computer calculates an edginess, which is an image variation from a differential value of data for adjacent picture elements, and determines object picture elements by selecting only images with a large variation. As optimum parameters for contrast correction and lightness compensation are calculated from image data for object picture elements, image processing indicators based on object picture elements are determined, and optimum imago processing can be performed automatically. After summing a luminance Distribution for each area of the image, which is a feature amount, while uniformly selecting picture elements, a reevaluation is performed by a weighting determined for each area, and a luminance distribution, strongly influenced by the luminance distribution of the photographed object is thus obtained with uniform sampling. After determining the intensity of this luminance distribution, the image data is converted, and image processing can therefore be performed with optimum intensity while reducing the processing amount.


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