The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2014

Filed:

Mar. 12, 2012
Applicants:

Nicholas R. Nickerson, Kentville, CA;

Jocelyn Elizabeth Egan, Ottawa, CA;

David Andrew Risk, Heatherton, CA;

Inventors:

Nicholas R. Nickerson, Kentville, CA;

Jocelyn Elizabeth Egan, Ottawa, CA;

David Andrew Risk, Heatherton, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/59 (2006.01); G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system comprising measuring concentrations of first and second isotopologues of a gas of interest within a first cavity that is sealably in contact with a soil location through an inlet membrane, and the first cavity being defined by chamber walls having openings covered by outlet membranes. Reference concentrations of the first and second isotopologues are measured in a second cavity having a closed bottom, the second cavity being defined by chamber walls having openings covered by more outlet membranes. Relative flux of the isotopologues can be calculated using the measured concentrations.


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