The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Jan. 25, 2010
Helmut Becker-roβ, Berlin, DE;
Stefan Florek, Berlin, DE;
Michael Okruss, Postdam, DE;
Leibniz-Institut Fur Analytische Wissenschaften—Isas—E.V., Dortmuund, DE;
Abstract
An Echelle spectrometer arrangement () with internal order separation contains an Echelle grating () and a dispersing element () for order separation so that a two-dimensional spectrum having a plurality of separate orders () can be generated, an imagine optical system (), a flat-panel detector (), and predispersion means () for predispersing the radiation into the direction of traverse dispersion of the dispersion element (). The arrangement is characterized in that the predispersion means () comprise a predispersion element which is arranged along the optical path behind the inlet spacing () inside the spectrometer arrangement. The imaging optical system is designed in such a manner that the predispersed radiation can be imaged onto an additional image plane () which does not have any boundaries in the predispersion direction and which is arranged along the optical path between the predispersion element () and the echelle grating (). Optical means () in the area of the predispersed spectrum are arranged to influence the spatial and/or the spectral beam density distribution on the detector ().