The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2014

Filed:

May. 14, 2012
Applicants:

Yu-yen Chen, New Taipei, TW;

Ruey-jiann Lin, New Taipei, TW;

Inventors:

Yu-Yen Chen, New Taipei, TW;

Ruey-Jiann Lin, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/042 (2006.01); G09G 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a system for estimating the tendency of pressure change on a touch panel are disclosed. The method includes: getting first left-image data and first right-image data by using a left image-capturing device and a right image-capturing device at a first time, respectively; calculating first estimation pressed-area parameter according to the first left-image data and the first right-image data; getting second left-image data and second right-image data by using the left image-capturing device and the right image-capturing device at a second time, respectively; calculating second estimation pressed-area parameter according to the second left-image data and the second right-image data; and compare the first estimation pressed-area parameter with the second estimation pressed-area parameter.


Find Patent Forward Citations

Chen, Yu-Yen. (2014). Method and system for estimating the tendency of pressure change on a touch panel (U.S. Patent No. 8681125). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8681125

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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