The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Feb. 06, 2009
Applicants:
Alan Daly, Luton, GB;
Xiaoyu Qiao, Hatfield, GB;
Ian Christopher Mayes, Ampthill, GB;
John Hansen, Harpenden, GB;
Inventors:
Alan Daly, Luton, GB;
Xiaoyu Qiao, Hatfield, GB;
Ian Christopher Mayes, Ampthill, GB;
John Hansen, Harpenden, GB;
Assignee:
GE Inspection Technologies Ltd., Bedfordshire, GB;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of detecting defects using eddy currents is disclosed. The method comprises:
Daly, Alan. (2014). Method and apparatus for phase sensitive detection of eddy current measurements (U.S. Patent No. 8680852). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8680852
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile