The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Dec. 01, 2010
Philip Frank Burnett, Niskayuna, NY (US);
Daniel Lawrence Banowetz, Glenville, NY (US);
Lisa Ann Hong, Schenectady, NY (US);
Philip Frank Burnett, Niskayuna, NY (US);
Daniel Lawrence Banowetz, Glenville, NY (US);
Lisa Ann Hong, Schenectady, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A force compensated probe for electrical measurement is provided and includes a support structure having a back plate and sidewalls, a probe for electrical measurement of an article and an elastic base disposed to supportively couple the probe to the back plate such that the probe normally protrudes away from the back plate beyond distal edges of the sidewalls, and, when the probe is applied to the article for the electrical measurement such that components of the support structure contact the article, a predefined load is consistently applied to the elastic base.