The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8680487 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 25, 2014

Filed:

Oct. 06, 2011
Applicants:

Teiji Nishio, Kashiwa, JP;

Yuusuke Egashira, Tokyo, JP;

Manabu Yamada, Tokyo, JP;

Inventors:

Teiji Nishio, Kashiwa, JP;

Yuusuke Egashira, Tokyo, JP;

Manabu Yamada, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61N 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A simulation device includes an input unit which receives an input of simulation data including material information of the irradiation target and irradiation information of a charged particle beam, and an arithmetic unit which calculates the dose distribution of the charged particle beam in the irradiation target on the basis of simulation data received by the input unit and the dose distribution kernel. The arithmetic unit segments the charged particle beam spread to a predetermined range at an intermediate portion in the traveling direction of the charged particle beam, hypothesizes a plurality of virtual shapes having conical spread with a segmented position as a start point, and calculates the dose distribution of the charged particle beam in the irradiation target on the basis of simulation data received by the input unit and a plurality of virtual shapes of the charged particle beam.


Find Patent Forward Citations

Nishio, Teiji. (2014). Charged particle dose simulation device, charged particle beam irradiation device, charged particle dose simulation method, and charged particle beam irradiation method (U.S. Patent No. 8680487). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8680487

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