The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Oct. 08, 2010
Hiroyuki Nose, Tokyo, JP;
Hajime Kuwabara, Tokyo, JP;
Tetsuya Kobayashi, Tokyo, JP;
IHI Corporation, Tokyo, JP;
Abstract
A method of non-destructive inspection of a subject body including one or more elements comprises irradiating the subject body with a neutron ray along an axis line passing through a reference point; synchronously detecting gamma rays from directions inclined at equal angles to the axis line at a plurality of measurement points disposed to have equivalent intervals radially from the axis line, respectively; measuring the detected gamma rays in a plurality of energy ranges; determining whether measured values in the respective energy ranges are beyond thresholds; determining energy ranges where all the measured values are beyond the thresholds; analyzing a type of an element from the determined energy ranges; and detecting a location of the analyzed type of the element in the subject body on the basis of the reference point, the respective measurement points, a relative position relative to a surface of the subject body, and the directions.