The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Apr. 25, 2006
Applicants:
Brent Rardin, Lafayette, IN (US);
James Mitchell Wells, Lafayette, IN (US);
Garth E. Patterson, Brookston, IN (US);
Inventors:
Brent Rardin, Lafayette, IN (US);
James Mitchell Wells, Lafayette, IN (US);
Garth E. Patterson, Brookston, IN (US);
Assignee:
Griffin Analytical Technologies, L.L.C., West Lafayette, IN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sample analysis apparatus () includes processing circuitry () coupled to a data set device () and a storage device () to acquire one data set from an analysis component () according to one analysis parameter set and to prepare another analysis parameter set using another previously acquired data set.