The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2014

Filed:

Oct. 14, 2011
Applicants:

Hauk Han, Hwaseong-si, KR;

Byoung-kyu Lee, Seoul, KR;

Jingi Hong, Yongin-si, KR;

Changwon Lee, Seongnam-si, KR;

Eungjoon Lee, Yongin-si, KR;

Je-hyeon Park, Suwon-si, KR;

Jeonggil Lee, Goyang-si, KR;

Inventors:

Hauk Han, Hwaseong-si, KR;

Byoung-Kyu Lee, Seoul, KR;

Jingi Hong, Yongin-si, KR;

Changwon Lee, Seongnam-si, KR;

Eungjoon Lee, Yongin-si, KR;

Je-Hyeon Park, Suwon-si, KR;

Jeonggil Lee, Goyang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01);
U.S. Cl.
CPC ...
Abstract

Semiconductor devices and methods of fabricating semiconductor devices that may include forming an insulation structure including insulation patterns that are sequentially stacked and vertically separated from each other to provide gap regions between the insulation patterns, forming a first conductive layer filling the gap regions and covering two opposite sidewalls of the insulation structure, and forming a second conductive layer covering the first conductive layer. A thickness of the second conductive layer covering an upper sidewall of the insulation structure is greater than a thickness of the second conductive layer covering a lower sidewall of the insulation structure.


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