The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Oct. 11, 2007
Jörg Müller, Sandersdorf, DE;
Jörg Isenberg, Leipzig, DE;
Jörn Suthues, Leipzig, DE;
Martin Bivour, Berlin, DD;
Jean Patrice Rakotoniaina, Halle/Saale, DE;
Jörg Müller, Sandersdorf, DE;
Jörg Isenberg, Leipzig, DE;
Jörn Suthues, Leipzig, DE;
Martin Bivour, Berlin, DD;
Jean Patrice Rakotoniaina, Halle/Saale, DE;
Q-Cells SE, Bitterfeld-Wolfen, DE;
Abstract
The invention relates to a method and device for characterizing wafers during the production of solar cells. Characterizing wafers includes a) providing a wafer and carrying out a production process with the wafer for producing a solar cell or a plurality of solar cells; b) carrying out a wet chemical step with the wafer during the production process, wherein the wet chemical step decreases an influence of the wafer surface on a lifetime of charge carriers in the wafer; c) irradiating the wafer with light for creating the charge carriers in the wafer during the wet chemical step or after the wet chemical step; d) determining the lifetime of the charge carriers created in step c); and e) characterizing the wafer by means of the lifetime determined in step d).