The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Dec. 02, 2010
Adrian Podoleanu, Kent, GB;
Michael Leitner, Linz, AT;
Adrian Podoleanu, Kent, GB;
Michael Leitner, Linz, AT;
Abstract
A spectral interferometry apparatus and method are disclosed, that can be used to monitor or measure an unknown length by following a characteristic of an indicating signal. The measurement is performed by adjusting an optical path difference (OPD) in an interferometer part of an interferometer configuration until sound or light or both are obtained with the desired strength and pitch. Embodiments are presented where the unknown length is the eye length. Spectral interrogation of the interferometer optical output is achieved by reading the signal of an analogue photodetector array in a spectrometer or by tuning a swept source and processing the signal of a photodetector. Sound of different pitches are produced either directly in this process, or by using a nonlinear amplifier, or a mixer. For enhanced signal, the array may be driven by a nonlinear clock or the swept source may be driven by a distorted driving signal.