The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Mar. 07, 2008
Applicants:
Takumi Yanagisawa, Tokyo, JP;
Masaru Hirose, Tokyo, JP;
Shunji Saruki, Tokyo, JP;
Inventors:
Assignee:
TDK Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/127 (2006.01); H04R 31/00 (2006.01); G11B 5/31 (2006.01); G11B 5/39 (2006.01); G01R 3/00 (2006.01); G01R 15/00 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G11B 5/127 (2013.01); G11B 5/3166 (2013.01); G11B 5/3173 (2013.01); G11B 5/3196 (2013.01); G11B 5/3903 (2013.01); G01R 3/00 (2013.01); G01R 15/00 (2013.01); G01R 19/00 (2013.01);
Abstract
The method according to the present invention includes the steps of: sequentially applying a plurality of different voltages to an MR element and sequentially detecting output signals from the MR element; and eliminating the MR element as a defective product when an evaluation value, based on a difference of SN ratios of the output signals from the MR element respectively obtained for each applied voltage, is less than a threshold value, and selecting the MR element as a non-defective product when the evaluation value is greater than or equal to the threshold value.