The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Apr. 09, 2008
He Yuan Huang, Beijing, CN;
Shih-gong LI, Beijing, CN;
Zhong Jie LI, Beijing, CN;
Jun Zhu, Beijing, CN;
He Yuan Huang, Beijing, CN;
Shih-Gong Li, Beijing, CN;
Zhong Jie Li, Beijing, CN;
Jun Zhu, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present invention provides a service testing method and system using a surrogate. The service testing method comprises steps of: generating, according to service description of a service to be simulated, a service-specific surrogate for said service to be simulated; deploying the generated service-specific surrogate onto a runtime system; specifying a test case by referring to the generated service-specific surrogate, wherein said test case comprises test configuration; and setting, according to the test configuration, a configuration option of the deployed surrogate on the runtime system. In the service testing method and system according to the present invention, parameters of the surrogate are dynamically configured without necessity of rewriting and deployment, thereby reducing the burden of designing and generating Mock objects.