The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Jan. 31, 2011
Applicants:
Dmitry Markuza, Yehud, IL;
Dror Schwartz, Holon, IL;
Moshe Eran Kraus, Mazkeret Batya, IL;
Inventors:
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract
An event-driven performance measurement technique provides a set of transaction definitions that specify transaction actions that correspond to start and end points of a transaction. Events associated with execution of an application are received by a processor-based machine. The machine uses the events to generate transactions in accordance with the set of transaction definitions. The transactions can be used to evaluate performance of the application.