The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
May. 17, 2010
Brian Erickson, Long Beach, CA (US);
Abhijit Manushree, Aliso Viejo, CA (US);
Yevgeny Naryzhny, Foothill Ranch, CA (US);
Vinay Kamath, Rancho Santa Margarita, CA (US);
Clement Lie, Mission Viejo, CA (US);
Elliot Middleton, Tyler, TX (US);
Brian Erickson, Long Beach, CA (US);
Abhijit Manushree, Aliso Viejo, CA (US);
Yevgeny Naryzhny, Foothill Ranch, CA (US);
Vinay Kamath, Rancho Santa Margarita, CA (US);
Clement Lie, Mission Viejo, CA (US);
Elliot Middleton, Tyler, TX (US);
Invensys Systems, Inc., Foxboro, MA (US);
Abstract
A multi-tiered replicated process database and corresponding method are disclosed for supporting replication between tiers. The multi-tiered replicated process database comprises a tier one (T1) database server computer including a process history database and a replication service. The replication service includes a set of accumulators. Each accumulator is adapted to render a summary T2 database tag data structure from a set of data values retrieved from the process history database for a specified T1 database tag. The replicated database system also includes a tier two (T2) database server computer comprising a consolidated database that includes process data replicated from a set of T1 database servers. At least a portion of the process data replicated from the set of T1 database servers is summary T2 database tag data rendered by the set of accumulators.