The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Jun. 02, 2010
H. Alan Wolf, Morristown, NJ (US);
Chung-min Cheng, Randolph, NJ (US);
Dalia G. Yablon, Livingston, NJ (US);
Alan M. Schilowitz, Highland Park, NJ (US);
Manuel S. Alvarez, Warrenton, VA (US);
Yvonne Mathez, Belvidere, NJ (US);
H. Alan Wolf, Morristown, NJ (US);
Chung-Min Cheng, Randolph, NJ (US);
George Akehurst, Belvidere, NJ (US);
Dalia G. Yablon, Livingston, NJ (US);
Alan M. Schilowitz, Highland Park, NJ (US);
Manuel S. Alvarez, Warrenton, VA (US);
ExxonMobil Research and Engineering Company, Annandale, NJ (US);
Abstract
Mechanical oscillators employ the use of resonance parameters, frequency and the quality factor Q, for the measurement of corrosion or deposition. The ability of a mechanical oscillator to measure small amounts of metal loss or deposition is not only dependent upon the mechanical design but is limited by the precision in determining the resonance frequency and Q. Methods for measuring these resonance parameters with a high precision in the presence of noise are provided. The increased degree of precision improves the utility of these devices as sensitive probes for corrosion and deposition (fouling) measurement. The increased degree of precision is enabled in part by employing curve fitting consistent with modeling the mechanical oscillator as a simple harmonic oscillator. This curve fitting procedure, combined with averaging and utilizing signal processing parameters to mitigate noise effects, adds precision in measuring resonance parameters.