The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Jan. 29, 2010
Applicants:

Jose M Martinez, Essex Junction, VT (US);

Chandramouli Visweswariah, Yorktown Heights, NY (US);

Francis Woytowich, Essex Junction, VT (US);

Jinjun Xiong, White Plains, NY (US);

Inventors:

Jose M Martinez, Essex Junction, VT (US);

Chandramouli Visweswariah, Yorktown Heights, NY (US);

Francis Woytowich, Essex Junction, VT (US);

Jinjun Xiong, White Plains, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, the invention is a method and apparatus for selecting voltage and frequency levels for use in at-speed testing. One embodiment of a method for selecting a set of test conditions with which to test an integrated circuit chip includes formulating a statistical optimization problem and obtaining a solution to the statistical optimization problem, where the solution is the set of test conditions.


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