The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Dec. 06, 2011
Lou Dietz, Mountain View, CA (US);
Lokesh Tatke, Sunnyvale, CA (US);
Suraj Somwanshi, Cupertino, CA (US);
Suhas Patil, Pune, IN (US);
Sujit Chivate, Pune, IN (US);
Lou Dietz, Mountain View, CA (US);
Lokesh Tatke, Sunnyvale, CA (US);
Suraj Somwanshi, Cupertino, CA (US);
Suhas Patil, Pune, IN (US);
Sujit Chivate, Pune, IN (US);
Ventana Medical Systems, Inc., Tucson, AZ (US);
Abstract
Provided herein are systems methods including a design of a microscope slide scanner for digital pathology applications which provides high quality images and automated batch-mode operation at low cost. The instrument architecture is advantageously based on a convergence of high performance, yet low cost, computing technologies, interfaces and software standards to enable high quality digital microscopy at very low cost. Also provided is a method based in part on a stitching method that allows for dividing an image into a number of overlapping tiles and reconstituting the image with a magnification without substantial loss of accuracy. A scanner is employed in capturing snapshot images. The method allows for overlapping images captured in consecutive snapshots.