The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Nov. 18, 2011
Anjan Goswami, Sunnyvale, CA (US);
Naren Chittar, San Jose, CA (US);
Ali Dasdan, San Jose, CA (US);
Sanjay Pundlkrao Ghatare, San Jose, CA (US);
Sandip Namdeo Gaikwad, Sunnyvale, CA (US);
Sung Hwan Chung, Fremont, CA (US);
Anjan Goswami, Sunnyvale, CA (US);
Naren Chittar, San Jose, CA (US);
Ali Dasdan, San Jose, CA (US);
Sanjay Pundlkrao Ghatare, San Jose, CA (US);
Sandip Namdeo Gaikwad, Sunnyvale, CA (US);
Sung Hwan Chung, Fremont, CA (US);
eBay, Inc., San Jose, CA (US);
Abstract
Image-based features may be significantly correlated with click-through rates of images that depict a product, which may provide a more formal basis for the informal notion that good quality images will result in better click-through rates, as compared to poor quality images. Accordingly, an image assessment machine is configured to analyze image-based features to improve click-through rates for shopping search applications (e.g., a product search engine). Moreover, the image assessment machine may rank search results based on image quality factors and may notify sellers about low quality images. This may have the effect of improving the brand value for an online shopping website and accordingly have a positive long-term impact on the online shopping website.