The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Mar. 20, 2012
Applicants:

Takayuki Iwai, Setagaya-ku, JP;

Makoto Takahashi, Yokohama, JP;

Masaharu Wada, Yokohama, JP;

Mariko Iizuka, Yokohama, JP;

Kimimasa Imai, Kawasaki, JP;

Inventors:

Takayuki Iwai, Setagaya-ku, JP;

Makoto Takahashi, Yokohama, JP;

Masaharu Wada, Yokohama, JP;

Mariko Iizuka, Yokohama, JP;

Kimimasa Imai, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory cell array of a first semiconductor chip includes a normal cell array and a spare cell array. A first defect address data output circuit outputs first defect address data indicating an address of a defective memory cell in the memory cell array. A first comparison circuit compares address data with the first defect address data and outputs a first match signal in case of matching. A second defect address data output circuit outputs second defect address data indicating an address of a defective memory cell in the memory cell array. A second comparison circuit compares the address data with the second defect address data and outputs a second match signal in case of matching.


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