The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Nov. 28, 2011
Applicant:

Jun Usami, Osaka, JP;

Inventor:

Jun Usami, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an optical displacement meter capable of accurately detecting a displacement of an object. A light-projecting part selectively irradiates a workpiece with first and second light whose polarization directions are different from each other. Reflected light from the workpiece is incident on a light-receiving element through a light-receiving lens. A waveform creating part creates first and second waveform data showing light-receiving amount distributions of the first and second light obtained by the light-receiving element. A waveform processing part calculates a ratio between mutually corresponding peaks in the first and second waveform data, and selects one peak from each of the first and second waveform data based on the calculated ratios, to detect a position of the peak.


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