The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Mar. 23, 2010
Joachim Ihlefeld, Dresden, DE;
Amer Tarraf, Kreuzlingen, CH;
Joachim Ihlefeld, Dresden, DE;
Amer Tarraf, Kreuzlingen, CH;
Baumer Optronic GmbH, Radeberg, DE;
Abstract
A device and process for determining sizes of particles of a particle stream. A first optical measuring system with a first dot matrix sensor and a lighting device, which transilluminates the measuring volume are provided. The first dot matrix sensor and the lighting device form a transmitted-light arrangement. The computing device determines projection areas of particles within the transilluminated measuring volume from the image data of the first dot matrix sensor. The optical measuring arrangement includes a second optical measuring system with a second dot matrix sensor for detecting the diffraction pattern of the particles. The computing device determines a size distribution of the particles in the measuring volume based on the projection areas and the diffraction pattern. The computing device forms the size distribution from particle sizes determined on the basis of the projection areas and from particle sizes determined on the basis of the diffraction pattern.