The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Jun. 01, 2012
Steven P Lansel, East Palo Alto, CA (US);
Brian A. Wandell, Stanford, CA (US);
Steven P Lansel, East Palo Alto, CA (US);
Brian A. Wandell, Stanford, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
A learning technique is provided that learns how to process images by exploiting the spatial and spectral correlations inherent in image data to process and enhance images. Using a training set of input and desired output images, regression coefficients are learned that are optimal for a predefined estimation function that estimates the values at a pixel of the desired output image using a collection of similarly located pixels in the input image. Application of the learned regression coefficients is fast, robust to noise, adapts to the particulars of a dataset, and generalizes to a large variety of applications. The invention enables the use of image sensors with novel color filter array designs that offer expanded capabilities beyond existing sensors and take advantage of typical high pixel counts.