The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Apr. 26, 2011
Applicants:

Morihiko Sakano, Hitachinaka, JP;

Mirai Higuchi, Mito, JP;

Takeshi Shima, Mito, JP;

Shoji Muramatsu, Hitachinaka, JP;

Inventors:

Morihiko Sakano, Hitachinaka, JP;

Mirai Higuchi, Mito, JP;

Takeshi Shima, Mito, JP;

Shoji Muramatsu, Hitachinaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G01C 11/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detection device of a planar area is provided. The detection device includes an image obtaining section for obtaining a left image and a right image; a planar area aligning section for setting given regions of interest to the obtained left image and the right image, and through use of a geometric transform function that matches the region of interest of the right image with the region of interest of the left image, performing geometric transform to generate a geometric transform image; and a planar area detecting section for detecting a planar area based on the geometric transform image and the region of interest of the right image. The planar area aligning section sets the planar area detected by the planar area detecting section as a given region of interest.


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