The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Mar. 28, 2011
Applicant:

Hiroshi Shimaya, Saitama, JP;

Inventor:

Hiroshi Shimaya, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A distance to an object is measured for each of a series of left images, and the count of a distance range including the calculated distance increases. A distance range with the highest frequency of appearance is specified from the counter information of a distance table counter, and a left image in which the distance included in the specified distance range is measured is selected. The adjustment amount of the parallax amount adjusted for the selected left image and a corresponding right image is determined to be the adjustment amount of the parallax amount of a panorama image. A series of left images is combined to generate a panorama image and a series of right images is combined to generate a panorama image. A panorama image displayed in stereoscopic view is generated based on the determined adjustment amount of the parallax amount.


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